William H. Angoff

Angoff was born on September 14, 1919, in Boston, Massachusetts.^[1] He graduated from Harvard University and earned a master's degree followed by a PhD from Purdue University.^[2]

Angoff first worked as a psychological testing expert for the United States Army during World War II.^[2]

Angoff worked for the Educational Testing Service (ETS) from 1950 to 1993.^[2] He became the director of developmental research in 1976.^[3] Over the course of his career, he helped improve the SAT, an exam taken by millions of American high school graduates.^[4] He also promoted the use of testing in his speeches and writing.^[4]

With his wife Eleanor, Angoff had a son and a daughter. They resided in Princeton, New Jersey.^[2]

Angoff died of a heart attack on January 5, 1993, in Princeton.^[5]

• Angoff, William H.; Huddleston, Edith Mary (1958). The Multi-level Experiment: A Study of a Two-level Test System for the College Board Scholastic Aptitude Test. Princeton, New Jersey: Educational Testing Service. OCLC 19297063.
• Angoff, William H.; Sharon, Amiel T. (1972). Patterns of Test and Item Difficulty for Six Foreign Language Groups on the Test of English as a Foreign Language. Princeton, New Jersey: Educational Testing Service. OCLC 6041289.
• Angoff, William H. (1984). Scales, Norms, and Equivalent Scores. Princeton, New Jersey: Educational Testing Service. OCLC 11235274.
• Angoff, William H. (1987). Philosophical Issues of Current Interest to Measurement Theorists. Princeton, New Jersey: Educational Testing Service. OCLC 21858166.
• Angoff, William H. (1989). Context Bias in the Test of English as a Foreign Language. Princeton, New Jersey: Educational Testing Service. OCLC 863188811.