John P. Hayes
American computer scientist
From Wikipedia, the free encyclopedia
John Patrick Hayes is an Irish-American computer scientist and electrical engineer, the Claude E. Shannon Chair of Engineering Science at the University of Michigan.[1] He supervised over 35 doctoral students, coauthored seven books and over 340 peer-reviewed publications.[2] His Erdös number is 2.
John P. Hayes | |
|---|---|
| Alma mater | University of Illinois at Urbana–Champaign |
| Known for | computer architecture textbook; research in circuit testing, quantum and stochastic computing |
| Awards | IEEE Computer Society Test Technology Technical Community Lifetime Contribution Medal |
| Scientific career | |
| Fields | Computer Science |
| Institutions | University of Michigan |
| Gernot Albert Metze | |
Doctoral students | |
Biography
Hayes was born and grew up in Newbridge, Ireland[3] and did his undergraduate studies at the National University of Ireland, Dublin, graduating in 1965. He went on to graduate studies at the University of Illinois at Urbana–Champaign, earning a master's degree in 1967 and a Ph.D. in 1970.[4] He was responsible for the logic design of the input-output channel control units of ILLIAC III.[2] After working in The Hague for Shell for two years, he returned to academia, taking a faculty position at the University of Southern California in 1972. In 1979 Hayes was a Visiting Associate Professor at Stanford. He moved to Michigan in 1982, where he was the founding director of the Advanced Computer Architecture Laboratory.[1] Hayes retired from University of Michigan in 2023.[2]
Research
Hayes is the author of the books
- Digital System Design and Microprocessors (McGraw-Hill, 1984, ISBN 0-07-027367-7)
- Introduction to Digital Logic Design (Addison-Wesley, 1993, ISBN 978-0-201-15461-0)
- Computer Architecture and Organization (3rd ed., McGraw-Hill, 2002, ISBN 978-0-07-286198-3)
- Quantum Circuit Simulation (with George F. Viamontes and Igor L. Markov, Springer, 2009, ISBN 978-90-481-3064-1)
- Design, Analysis and Test of Logic Circuits Under Uncertainty, (with Smita Krishnaswamy and Igor L. Markov, Springer, 2012, ISBN 978-90-481-9643-2)
Hayes has written extensively on the use of hypercube graphs in supercomputing,[5] [6] [7] He has also written highly cited research papers on fault-tolerant design,[8] reversible computing,[9] and stochastic computing.[10]
Awards and honors
Hayes became an IEEE Fellow in 1985 "for contributions to digital testing techniques and to switching theory and logical design",[11] and an ACM Fellow in 2001 "for outstanding contributions to logic design and testing and to fault-tolerant computer architecture."[12] In 2004, the University of Illinois Urbana-Champaign department of electrical and computer engineering gave him their distinguished alumni award.[4]
In 2013, the IEEE Computer Society Test Technology Technical Community honored Hayes with Lifetime Contribution Medal.[13]
In 2014, Hayes was recognized with ACM Special Interest Group on Design Automation Pioneering Achievement Award "for his pioneering contributions to logic design, fault tolerant computing, and testing.”[14][15]
Best paper awards
- John P. Hayes, Trevor N. Mudge, Quentin F. Stout, Stephen Colley, John Palmer: A Microprocessor-based Hypercube Supercomputer. IEEE Micro 6(5): 6-17 (1986)
- Ram Raghavan, John P. Hayes: On randomly interleaved memories. ACM/IEEE Supercomputing Conference 1990: 49-58
- Avaneendra Gupta, John P. Hayes: A Hierarchical Technique for Minimum-Width Layout of Two-Dimensional CMOS Cells. VLSI Design 1997: 15-20
- HyungWon Kim, John P. Hayes: Delay Fault Testing of Designs with Embedded IP Cores. IEEE VLSI Test Symposium (VTS) 1999: 160-167
- Vivek V. Shende, Aditya K. Prasad, Igor L. Markov, John P. Hayes:Synthesis of reversible logic circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22(6): 710-722 (2003)[16]
- Smita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes: Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices. Design Automation and Test in Europe (DATE) 2005: 282-287[17]
- Pai-Shun Ting, John P. Hayes: Eliminating a hidden error source in stochastic circuits. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2017: 1-6.[18]