Edward B. Eichelberger

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Edward B. Eichelberger (born February 8, 1934, in Norfolk, VA) is an American engineer and wrestler. He holds the distinctions of IBM Fellow and IEEE Fellow (1986) for contributions to VLSI chip design, integrated circuit design, and electronic design automation.[1] Eichelberger shared with Thomas W. Williams (engineer) the 1989 IEEE Computer Society W. Wallace McDowell Award[1] “for developing the level-sensitive scan technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.” In 2000, Eichelberger received the IEEE Test Technology Technical Council's Lifetime Contribution Medal.[2]

In 2009, Eichelberger was inducted in the National Wrestling Hall of Fame.[3]

As a wrestler, Eichelberger won three state championships for Granby High School.[3] While at Lehigh University, he achieved a career record of 55-3-1 in college wrestling and was Lehigh's first three-time All-America champion.[3] Eichelberger obtained a B.S. degree in electrical engineering from Lehigh University in 1956. He then worked at IBM on solid state circuit design for three years. Eichelberger received a Ph.D. in electrical engineering from Princeton University in 1963.

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