Helium atom scattering

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Helium atom scattering (HAS) is a surface analysis technique used in materials science. It provides information about the surface structure and lattice dynamics of a material by measuring the diffracted atoms from a monochromatic helium beam incident on the sample.

The first recorded helium diffraction experiment was completed in 1930 by Immanuel Estermann and Otto Stern[1] on the (100) crystal face of lithium fluoride. This experimentally established the feasibility of atom diffraction when the de Broglie wavelength, λ, of the impinging atoms is on the order of the interatomic spacing of the material. At the time, the major limit to the experimental resolution of this method was due to the large velocity spread of the helium beam. It wasn't until the development of high pressure nozzle sources capable of producing intense and strongly monochromatic beams in the 1970s that HAS gained popularity for probing surface structure. Interest in studying the collision of rarefied gases with solid surfaces was helped by a connection with aeronautics and space problems of the time. Plenty of studies showing the fine structures in the diffraction pattern of materials using helium atom scattering were published in the 1970s. However, it wasn't until a third generation of nozzle beam sources was developed, around 1980, that studies of surface phonons could be made by helium atom scattering. These nozzle beam sources were capable of producing helium atom beams with an energy resolution of less than 1meV, making it possible to explicitly resolve the very small energy changes resulting from the inelastic collision of a helium atom with the vibrational modes of a solid surface, so HAS could now be used to probe lattice dynamics. The first measurement of such a surface phonon dispersion curve was reported in 1981,[2] leading to a renewed interest in helium atom scattering applications, particularly for the study of surface dynamics.

Basic principles

Surface sensitivity

Generally speaking, surface bonding is different from the bonding within the bulk of a material. In order to accurately model and describe the surface characteristics and properties of a material, it is necessary to understand the specific bonding mechanisms at work at the surface. To do this, one must employ a technique that is able to probe only the surface, we call such a technique "surface-sensitive". That is, the 'observing' particle (whether it be an electron, a neutron, or an atom) needs to be able to only 'see' (gather information from) the surface. If the penetration depth of the incident particle is too deep into the sample, the information it carries out of the sample for detection will contain contributions not only from the surface, but also from the bulk material. While there are several techniques that probe only the first few monolayers of a material, such as low-energy electron diffraction (LEED), helium atom scattering is unique in that it does not penetrate the surface of the sample at all! In fact, the scattering 'turnaround' point of the helium atom is 3-4 angstroms above the surface plane of atoms on the material. Therefore, the information carried out in the scattered helium atom comes solely from the very surface of the sample. A visual comparison of helium scattering and electron scattering is shown below:

Helium Atom Scattering (HAS) and Low Energy Electron Diffraction (LEED) scheme of principle

Helium at thermal energies can be modeled classically as scattering from a hard potential wall, with the location of scattering points representing a constant electron density surface. Since single scattering dominates the helium-surface interactions, the collected helium signal easily gives information on the surface structure without the complications of considering multiple electron scattering events (such as in LEED).

Scattering mechanism

A qualitative sketch of the elastic one-dimensional interaction potential between the incident helium atom and an atom on the surface of the sample is shown here:

This potential can be broken down into an attractive portion due to Van der Waals forces, which dominates over large separation distances, and a steep repulsive force due to electrostatic repulsion of the positive nuclei, which dominates the short distances. To modify the potential for a two-dimensional surface, a function is added to describe the surface atomic corrugations of the sample. The resulting three-dimensional potential can be modeled as a corrugated Morse potential as:[3]

The first term is for the laterally-averaged surface potential - a potential well with a depth D at the minimum of z = zm and a fitting parameter α, and the second term is the repulsive potential modified by the corrugation function, ξ(x,y), with the same periodicity as the surface and fitting parameter β.

Helium atoms, in general, can be scattered either elastically (with no energy transfer to or from the crystal surface) or inelastically through excitation or deexcitation of the surface vibrational modes (phonon creation or annihilation). Each of these scattering results can be used in order to study different properties of a material's surface.

Why use helium atoms?

There are several advantages to using helium atoms as compared with x-rays, neutrons, and electrons to probe a surface and study its structures and phonon dynamics. As mentioned previously, the lightweight helium atoms at thermal energies do not penetrate into the bulk of the material being studied. This means that in addition to being strictly surface-sensitive they are truly non-destructive to the sample. Their de Broglie wavelength is also on the order of the interatomic spacing of materials, making them ideal probing particles. Since they are neutral, helium atoms are insensitive to surface charges. As a noble gas, the helium atoms are chemically inert. When used at thermal energies, as is the usual scenario, the helium atomic beam is an inert probe (chemically, electrically, magnetically, and mechanically). It is therefore capable of studying the surface structure and dynamics of a wide variety of materials, including those with reactive or metastable surfaces. A helium atom beam can even probe surfaces in the presence of electromagnetic fields and during ultra-high vacuum surface processing without interfering with the ongoing process. Because of this, helium atoms can be useful to make measurements of sputtering or annealing, and adsorbate layer depositions. Finally, because the thermal helium atom has no rotational and vibrational degrees of freedom and no available electronic transitions, only the translational kinetic energy of the incident and scattered beam need be analyzed in order to extract information about the surface.

Instrumentation

The accompanying figure is a general schematic of a helium atom scattering experimental setup. It consists of a nozzle beam source, an ultra high vacuum scattering chamber with a crystal manipulator, and a detector chamber. Every system can have a different particular arrangement and setup, but most will have this basic structure.

Sources

The helium atom beam, with a very narrow energy spread of less than 1meV, is created through free adiabatic expansion of helium at a pressure of ~200bar into a low-vacuum chamber through a small ~5-10μm nozzle.[4] Depending on the system operating temperature range, typical helium atom energies produced can be 5-200meV. A conical aperture between A and B called the skimmer extracts the center portion of the helium beam. At this point, the atoms of the helium beam should be moving with nearly uniform velocity. Also contained in section B is a chopper system, which is responsible for creating the beam pulses needed to generate the time of flight measurements to be discussed later.

Scattering chamber

The scattering chamber, area C, generally contains the crystal manipulator and any other analytical instruments that can be used to characterize the crystal surface. Equipment that can be included in the main scattering chamber includes a LEED screen (to make complementary measurements of the surface structure), an Auger analysis system (to determine the contamination level of the surface), a mass spectrometer (to monitor the vacuum quality and residual gas composition), and, for working with metal surfaces, an ion gun (for sputter cleaning of the sample surface). In order to maintain clean surfaces, the pressure in the scattering chamber needs to be in the range of 10−8 to 10−9 Pa. This requires the use of turbomolecular or cryogenic vacuum pumps.

Crystal manipulator

The crystal manipulator allows for at least three different motions of the sample. The azimuthal rotation allows the crystal to change the direction of the surface atoms, the tilt angle is used to set the normal of the crystal to be in the scattering plane, and the rotation of the manipulator around the z-axis alters the beam incidence angle. The crystal manipulator should also incorporate a system to control the temperature of the crystal.

Detector

After the beam scatters off the crystal surface, it goes into the detector area D. The most commonly used detector setup is an electron bombardment ion source followed by a mass filter and an electron multiplier. The beam is directed through a series of differential pumping stages that reduce the noise-to-signal ratio before hitting the detector. A time-of-flight analyzer can follow the detector to take energy loss measurements.

Elastic measurements

Inelastic measurements

References

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