Jacob Savir
From Wikipedia, the free encyclopedia
AlmamaterTechnion – Israel Institute of Technology (B.Sc., 1968; M.Sc., 1974)
Stanford University (M.S., 1976; Ph.D., 1978)
Stanford University (M.S., 1976; Ph.D., 1978)
Awards
InstitutionsNew Jersey Institute of Technology
Jacob Savir | |
|---|---|
| Alma mater | Technion – Israel Institute of Technology (B.Sc., 1968; M.Sc., 1974) Stanford University (M.S., 1976; Ph.D., 1978) |
| Awards | |
| Scientific career | |
| Institutions | New Jersey Institute of Technology |
| Website | web |
Jacob Savir is a professor in the Department of Electrical and Computer Engineering[1] at the New Jersey Institute of Technology and an IEEE Fellow.[2]
He is credited with developing two approaches to detecting Transition Faults (a type of Fault model) that might occur during the manufacturing of semiconductor chips, viz., the Skewed-Load Transition Test (Launch-off-shift at-speed test) and the Broad-side delay test (Launch on Capture at-speed test).[citation needed]
