KP Technology
From Wikipedia, the free encyclopedia
| Industry | Research, defence, energy, material science, corrosion, medical |
|---|---|
| Founder | Professor Iain Baikie |
| Headquarters | Wick, , |
Number of locations | Wick, Boston |
Key people | Professor Kevin Pierson, CEO |
| Products | Kelvin probe, air photoemission, products and systems for materials science and physics |
| Website |
KP Technology Ltd was established in 2000 as an international multidisciplinary engineering, science and technology research company[1] offering services particularly in the research, material, energy, defence, environment, corrosion and medical sectors. It specialises in Kelvin probes, surface photovoltage and air photoemission.
KP Technology specialises in design, design support, research and consultancy. It operates in over 35 countries, with primary bases in Europe and North America. It is based in Wausau, Wisconsin, in the Village of Kronenwetter and is recognised as a "state of the art" local company.[2][3]
Originally formed as a spin off from CEO Prof Iain Baikie research, KP Technology has engaged in scientific research for more than a decade.
KP Technology has an active and successful research lab. It has partnered with Harvard University and MIT, CERN Institute, European Space Agency and the University of St Andrews among others.[4]
The company has won two Queens Awards and a John Logie Baird Award for Impact through Innovation.[5]
Notable scientific publications and patents
Collaborative papers
- Work function engineering in low-temperature metals, Appl. Phys. Lett. 94, 113504 (2009);
Affiliations:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts,
Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139,
KP Technology Ltd., Wick KW1 5LE, United Kingdom
Sole papers
- Ambient pressure photoemission spectroscopy of metal surfaces, Applied Surface Science Volume 323, 30 December 2014, Pages 45–53
- Near ambient pressure photoemission spectroscopy of metal and semiconductor surfaces. Phys. Status Solidi C, 12: 259–262.
- Dual Mode Kelvin Probe: Featuring Ambient Pressure Photoemission Spectroscopy and Contact Potential Difference, Energy Procedia Volume 60, 2014, Pages 48-56
Affiliation
KP Technology Ltd, 12 A Burn Street, Wick KW1 5EH, Caithness, UK
Patent
- PCT/GB2013/050427
A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in “dual” photoemission and contact potential difference (CPD) measurement modes.