1 2 K.Nikawa and S. Inoue(1996).“New Laser Beam Heating Methods Applicable to Fault Localization and Defect Detection in VLSI Devices”.Proc. International Reliability Physics Symposium: pp.346-354.
↑ Kiyoshi Nikawa(1981).“Monte Carlo Calculations Based on the Generalized Electromigration Failure Model”.Int.Reliab.Phys.Symp., IEEEVol.CH1619-6: pp.175-181.
↑ K. Nikawa, N. Nasu, M. Murase, T. Kaito, T. Adachi, and S. Inoue:(1989).“New Applications of Focused Ion Beam Technique to Failure Analysis and Process Monitoring of VLSI”.Proc. International Reliability Physics Symposium, IEEE: pp.43-52.
↑ K. Nikawa and S. Tozaki,(1993).“Novel OBIC observation method for detecting defects in Al stripes under current stressing”.Proc. International Symposium for Testing and Failure Analysis: pp.303-310.
